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太赫茲近場(chǎng)光學(xué)顯微鏡 - THz-NeaSNOM
--30nm光學(xué)信號(hào)空間分辨率
太赫茲(THz)光源波長(zhǎng)較大,一般在300微米左右。由于衍射極限的存在,THz遠(yuǎn)場(chǎng)測(cè)量系統(tǒng)的光學(xué)空間分辨率一般被限制在150微米左右。該THz光遠(yuǎn)場(chǎng)測(cè)量結(jié)果的準(zhǔn)確度經(jīng)常無(wú)法滿足對(duì)材料科學(xué)研究,尤其是需要納米分辨率的微細(xì)尺度材料分布研究(例如半導(dǎo)體芯片中各個(gè)組成:源極,漏極,柵極)的實(shí)驗(yàn)。THz-NeaSNOM近場(chǎng)光學(xué)顯微鏡的出現(xiàn)為此難題提供了一個(gè)很好的解決方案。
德國(guó)neaspec公司與Fraunhofer IPM在neaspec公司neaSNOM近場(chǎng)光學(xué)顯微鏡的基礎(chǔ)上,已經(jīng)成功研發(fā)了一套易用使用且THz系統(tǒng)的空間分辨率達(dá)到30nm的實(shí)驗(yàn)設(shè)備。
產(chǎn)品特點(diǎn)/基本參數(shù)
+ 優(yōu)于30nm的空間分辨率 + 常用THz光范圍:0.1-3THz + **設(shè)計(jì)的寬波段拋面鏡 + THz研究可使用商業(yè)化的AFM探針 + THz-TDS使用飛秒激光光源 + 簡(jiǎn)單易用,穩(wěn)定性高 |
半導(dǎo)體結(jié)構(gòu)表征—30nm空間分辨率
THz-NeaSNOM近場(chǎng)光學(xué)顯微鏡(下圖左)對(duì)半導(dǎo)體結(jié)構(gòu)的測(cè)量結(jié)果圖。
該結(jié)果表明硅襯底(上圖左,灰色)上的SiO(一氧化硅)的尺寸大約在1.5×1 平方微米。通過(guò)分析左側(cè)的高度數(shù)據(jù),可以知道該一氧化硅結(jié)構(gòu)僅僅只有大約22納米厚度。雖然該層狀結(jié)構(gòu)非常薄,但THz-NeaSNOM近場(chǎng)光學(xué)顯微鏡(下圖左)在測(cè)量高度的同時(shí)仍然能夠記錄該結(jié)構(gòu)與襯底的近場(chǎng)光學(xué)信號(hào)的明顯不同襯度的結(jié)果。該THz-NeaSNOM近場(chǎng)光學(xué)顯微鏡不僅在測(cè)量非常薄樣品的時(shí) 候靈敏度非常高,而且通過(guò)分析近場(chǎng)光學(xué)信號(hào)數(shù)據(jù)(下圖右)也證實(shí)了它超高的空間分辨率(~25-30nm)。
表征半導(dǎo)體器件 Nature 456,454(2008)
超快機(jī)制研究納米線 Nature Photonics 8,841(2014)
部分用戶好評(píng)與列表(排名不分先后)
neaspec公司產(chǎn)品以其穩(wěn)定的性能、極高的空間分辨率和良好的用戶體驗(yàn),得到了國(guó)內(nèi)外眾多科學(xué)家的認(rèn)可和肯定......
"The neaSNOM microscope with it’s imaging and nano-FTIR mode is the most useful research instrument in years, bringing genuinely new insights." Prof. Dmitri Basov 美國(guó) 加州大學(xué) University of California San Diego Department of Physics La Jolla, USA | |
"We were looking for a flexible research tool capable of characterizing our energy storage materials at the nanoscale. neaSNOM proofed to be the system with the highest spatial resolution in infrared imaging and spectroscopy and brings us substantial new insights for our research” Dr. Jaroslaw Syzdek 美國(guó) 勞倫斯伯克利國(guó)家實(shí)驗(yàn)室 Lawrence Berkeley National Laboratory Environmental Energy Technologies Division Berkeley, USA | |
"The neaSNOM microscope boosted my research in plasmonic properties of noble metal nanocrystals, optical resonances of dielectric nanostructures, and plasmon polaritons of graphene-like two dimensional nanomaterials." 陳煥君 教授 中國(guó) 中山大學(xué) Sun Yat-sen University China | |
"As a near-field expert I was quickly convinced that neaSNOM is the only optical AFM microscope completely satisfying the needs of demanding near-field experiments. It’s the best comercially available technology and in addition really easy to use." Prof. Thomas Taubner 德國(guó) 亞琛工業(yè)大學(xué) RWTH Aachen Metamaterials & Nano-Optics Aachen, Germany | |
"As a newcomer to the near-field optics I am very grateful for the prompt and competent support provided by neaspec’s experts." Dr. Edward Yoxall 英國(guó) 帝國(guó)理工大學(xué) Imperial College London Department of Physics London, United Kingdom | |
"After many years of research and development in near-field microscopy, we finally made our dream come true to perform infrared imaging & spectroscopy at the nanoscale. With neaSNOM we can additionally realize Raman, fluorescence and non-linear nano-spectroscopy." Prof. Rainer Hillenbrand 西班牙 納米科學(xué)協(xié)同研究中心 CIC nanoGUNE Research Center Co-Founder and Scientific Advisor San Sebastian, Spain | |
"A unique advantage of the neaSNOM microscope is that it can be applied to many fields of scientific research such as Chemistry, Semiconductor Technology, Polymer Science and even Life-Science." Dr. Fritz Keilmann 德國(guó) 慕尼黑大學(xué) Ludwig-Maximilians Universit?t München Co-Founder and Scientific-Advisor Munich, Germany |
南京大學(xué) | 中山大學(xué) |
首都師范大學(xué) | 蘇州大學(xué) |
University of San Diego,USA | University of Southampton, UK |
CIC nanoGUNE San Sebastion, Spain | LBNL Berkeley, USA |
Fraunhofer Institut ILT Aachen, Germany | Max-Planck-Institut of Quantum Optics, Garching, Germany |
University of Bristol, UK | RWTH Aachen, Germany |
California State University Long Beach, USA…… |
暫無(wú)數(shù)據(jù)!